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TC74HCT273AP/AF
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74HCT273AP,TC74HCT273AF
Octal D-Type Flip Flop with Clear
The TC74HCT273A is a high speed CMOS OCTAL D-TYPE FLIP FLOP fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power dissipation. Their inputs are compatible with TTL, NMOS, and CMOS output voltage levels. Information signals applied to D inputs are transferred to the Q outputs on the positive going edge of the clock pulse. When the CLR input is held "L", the Q outputs are at a low logic level independent of the other inputs. All inputs are equipped with protection circuits against static discharge or transient excess voltage.
TC74HCT273AP
TC74HCT273AF
Features
* * * * * * * * High speed: fmax = 90 MHz (typ.) at VCC = 5 V Low power dissipation: ICC = 4 A (max) at Ta = 25C Compatible with TTL outputs: VIH = 2.0 V (min) VIL = 0.8 V (max) Wide interfacing ability: LSTTL, NMOS, CMOS Output drive capability: 10 LSTTL loads Symmetrical output impedance: |IOH| = IOL = 4 mA (min) Balanced propagation delays: tpLH - tpHL Pin and function compatible with 74LS273 Weight DIP20-P-300-2.54A SOP20-P-300-1.27A : 1.30 g (typ.) : 0.22 g (typ.)
Pin Assignment
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TC74HCT273AP/AF
IEC Logic Symbol
Truth Table
Inputs Output CK X Q L L H Qn
CLR
L H H H
D X L H X
Function Clear No Change
X: Don't care
System Diagram
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Absolute Maximum Ratings (Note 1)
Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Rating -0.5~7 -0.5~VCC + 0.5 -0.5~VCC + 0.5 20 20 25 50 500 (DIP) (Note 2)/180 (SOP) -65~150 Unit V V V mA mA mA mA mW C
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = -40~65C. From Ta = 65 to 85C a derating factor of -10 mW/C shall be applied until 300 mW.
Operating Ranges (Note)
Characteristics Supply voltage Input voltage Output voltage Operating temperature Input rise and fall time Symbol VCC VIN VOUT Topr tr, tf Rating 4.5~5.5 0~VCC 0~VCC -40~85 0~500 Unit V V V C ns
Note:
The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND.
Electrical Characteristics
DC Characteristics
Test Condition Characteristics High-level input voltage Low-level input voltage High-level output voltage Low-level output voltage Input leakage current Quiescent supply current Symbol VCC (V) IOH = -20 A VIN = VIH or IOH = -4 mA VIL IOL = 20 A VIN = VIH or IOL = 4 mA VIL VIN = VCC or GND VIN = VCC or GND Per input: VIN = 0.5 V or 2.4 V Other input: VCC or GND 4.5~ 5.5 4.5~ 5.5 4.5 4.5 4.5 4.5 5.5 5.5 5.5 Min 2.0 4.4 4.18 Ta = 25C Typ. 4.5 4.31 0.0 0.17 Max 0.8 0.1 0.26 0.1 4.0 2.0 Ta = -40~85C Min 2.0 4.4 4.13 Max 0.8 0.1 0.33 1.0 40.0 2.9 Unit
VIH VIL VOH
V V V
VOL IIN ICC IC
V A A mA
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Timing Requirements (input: tr = tf = 6 ns)
Characteristics Symbol Test Condition VCC (V) Minimum pulse width (CK) Minimum pulse width ( CLR ) tW (L) tW (H) 4.5 5.5 Ta = 25C Typ. Limit 15 14 Ta = -40 ~85C Limit 19 17 ns Unit
tW (L)
4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5
15 14 10 10 5 10 10 9 30 35
19 17 13 13 6 13 13 12 24 28
ns
Minimum set-up time
ts
ns
Minimum hold time Minimum removal time ( CLR ) Clock frequency
th
ns
trem
ns
f
MHz
AC Characteristics (CL = 15 pF, VCC = 5 V, Ta = 25C, input: tr = tf = 6 ns)
Characteristics Output transition time Propagation delay time (CK-Q) Propagation delay time ( CLR -Q) Maximum clock frequency Symbol tTLH tTHL tpLH tpHL tpHL tpHL fmax Test Condition
Min
Typ. 4
Max 8
Unit ns
15
25
ns

18 90
28
ns MHz
40
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AC Characteristics (CL = 50 pF, input: tr = tf = 6 ns)
Test Condition Characteristics Symbol tTLH tTHL tpLH tpHL tpLH tpHL fmax CIN CPD (Note) VCC (V)
Ta = 25C Min

Ta = -40~85C Max 15 14 30 27 32 29

Typ. 9 8 19 17 22 18 71 81 5 29
Min

Max 19 18 38 34 40 36

Unit
Output transition time Propagation delay time (CK-Q) Propagation delay time ( CLR -Q) Maximum clock frequency Input capacitance Power dissipation capacitance
4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5

ns
ns
ns
30 35

24 28

MHz pF pF
10
10
Note:
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPDVCCfIN + ICC/8 (per flip flop) And the total CPD when n pcs. of flip flop operate can be gained by the following equation: CPD (total) = 18 + 11n
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Package Dimensions
Weight: 1.30 g (typ.)
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Package Dimensions
Weight: 0.22 g (typ.)
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RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN GENERAL
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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